Reactive ion etching of quartz and Pyrex for microelectronic applications

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Reactive ion etching of quartz and Pyrex for microelectronic applications

The reactive ion etching of quartz and Pyrex substrates was carried out using CF4 /Ar and CF4 /O2 gas mixtures in a combined radio frequency ~rf!/microwave ~mw! plasma. It was observed that the etch rate and the surface morphology of the etched regions depended on the gas mixture ~CF4 /Ar or CF4 /O2), the relative concentration of CF4 in the gas mixture, the rf power ~and the associated self-in...

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ژورنال

عنوان ژورنال: Journal of Applied Physics

سال: 2002

ISSN: 0021-8979,1089-7550

DOI: 10.1063/1.1503167